Overbridge Technology Honored with Worth-a-Look! Award at Graph Expo 2006
EMMAUS, PA—11/06/06—Overbridge Technology was one of only 22 companies to receive the prestigious Worth-a-Look! Award, presented at Graph Expo and Converting Expo 2006, held recently in Chicago.
Presentation of the MustSee’Em and Worth-a-Look! Awards is one of the highlights of the annual Executive Outlook conference, which immediately preceded Graph Expo. All of the 5,700 products shown at Graph Expo are eligible for consideration, and encouraged to submit applications with their product information for nomination. Of the 108 companies selected for further consideration, Overbridge Technology was one of a handful recognized for offering innovative products to the thousands of show attendees.
Overbridge’s Eclipse Count was recognized as Worth-a-Look; it provides a proven solution for production cost containment for web presses of all sizes and configurations, via its incredibly accurate signature count. One signature in 1000 is waste signature, resulting in no more shortages or overages.
With Eclipse Count, press operators not only get accurate net signature counts, but pallet/skid creation and content, and real time and historical automated press production reporting.
In announcing the award, Overbridge principal Mark Daugherty said, “The users of Eclipse Count thought that the device should receive this recognition at Graph Expo. I am pleased they were proven to be correct. We are proud to be singled out as a Worth-a-Look award winner, given the huge number of innovative products shown at Graph Expo.”
Overbridge also showcased Eclipse Roll at Graph Expo; it monitors and records true paper linear yield and calculates actual basis weight, providing real time and historical paper usage by roll.
The seamless integration of Overbridge’s Eclipse Roll and Eclipse Count provides consolidated press production/paper consumption reporting. The open database design readily allows integration into other existing business systems.